Electronics Book Reviews: Built In Test for VLSI

 
Reviews of Built In Test for VLSI: Pseudorandom Techniques

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Review #1: Great Digital test book
Review #2: BEST TEST BOOK





Review #1

Great Digital test book

This is a great book written from professionals in the materia. I personally took the class with Dr. Savir and he is not only a great professor but this book is well worth purchasing.






Review #2

BEST TEST BOOK

This is the best test book I have read. It covers all aspects of BIST with emphasis on pseudorandom techniques. It does not cover as much about testing as "Digital System Testing and Testable Design" but it is well worth its price tag.




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Built In Test for VLSI: Pseudorandom Techniques

by Paul H. Bardell

Format: Hardcover
Publication Date: 1987-10
Publisher: Wiley-Interscience
ISBN: 0471624632

    List Price: $208.00
Price: $78.00
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Page last updated on: 22 Mar 2010